Answer the following in brief. (20 marks) Discuss Scanning electron microscopy. The scanning electron microscope (SEM) uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition, and crystalline structure and orientation of materials making up the sample. Differentiate between SEM and FESEM. The difference between a FESEM and an SEM lies in the electron generation system. As a source of electrons, the FESEM uses a field emission gun that provides extremely focused high and low-energy electron beams, which greatly improves spatial resolution and enables work to be carried out at very low potentials . This helps to minimise the charging effect on non-conductive specimens and to avoid damage to electron beam-sensitive samples. What is AFM? The atomic force microscope (AFM) is ...
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